Nanoscale distribution of charge is shown in many interfacial systems from electrode surfaces in electrocatalysis and to cell membranes in biology. The ability to map the distribution of surface charge with high resolution is fundamentally important in understanding these interfacial systems. Scanning ion conductance microscopy (SICM) has been recently demonstrated as a promising tool for surface charge mapping based on surface charge induced changes in the conductance. Charge and topography are deconvoluted via conductance measurement at least two different voltage biases.  In this presentation, we demonstrate a new nanopipette based method for the surface charge using open circuit potential in SICM. The surface charge can be measured from the potentiometric approach curves (open circuit potential vs pipette-to-substrate distance). Such a method simplifies the mapping and quantification of surface charge density at the nanoscale.<br/>

Nanoscale surface charge mapping using open circuit scanning ion conductance microscopy

Macromolecular Chemistry: The Second Century

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ACS Spring 2020 National Meeting & Expo

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.