Significant advances have been made in the understanding of charge transport in molecular junctions, revealing rectification, negative differential resistance, and switching. Recent studies demonstrate these behaviors not only arise from intrinsic molecule properties, but also are influenced by other factors, including molecular conformation, electrode materials, and local molecular environments, as well as process-induced artifacts.  Thus, a major challenge for technological implementation is the development of a generalized method to definitively correlate conduction properties with electrically active molecular structures.  In this talk, we present a versatile, robust test platform based on parallel integration of crossed nanowire junctions (X-nWJs) that meets this challenge through the capability of combined electrical and multiple in-situ spectroscopic measurements over wide temperatures (4 � 300 K) with the significant advantage of scalability over orders of magnitude for varying the total number and types of molecules addressed with contacts to diverse materials.

Crossed-nanowire molecular junctions:  A multispectroscopy platform for conduction-structure correlations

243rd National Meeting (2012)

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