Tapping mode is a widely used basic imaging mode of atomic force microscopy. The force between the tip and sample results from various physical and chemical interactions, such as electrostatic forces, physical repulsive forces, van der Waals forces, dipole-dipole interactions, magnetic forces, chemical bonding, hydrogen bonding, or frictional forces.  Many advanced imaging modes have been developed and continuously improved to map physical and chemical information. Advanced imaging modes based on cantilever oscillation will be introduced, including phase imaging, MFM (magnetic force microscopy), EFM (electrostatic force microscopy) and KFM (Kelvin force microscopy. We will discuss the basic physics behind the advanced AC imaging modes, the mathematics of the feedback mechanism and example applications in different research fields. The latest AFM modes: frequency modulated KFM and scanning microwave will be described. Examples will be given using frequency modulation technology in the research of fuel cell membrane development and battery related research.

Beyond tapping: Basic and advanced imaging modes based on the oscillation of an atomic force microscope cantilever

245th National Meeting (2013)

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