In this study, the structural evolution of cobalt phosphate thin films was examined as a function of annealing conditions.  Several identical cobalt phosphate thin films were prepared by spin coating aqueous cobalt phosphate solutions onto silicon substrates.  Films were annealed under systematically varying annealing conditions, and the structural evolution of the films was monitored using x-ray diffraction and reflectivity.  This was performed for films with multiple initial thicknesses to examine the influence of the film thickness on the structure of the film.  Detailed crystal structures from selected films were examined using Rietveld refinement, and the film structures were compared to analogous bulk crystals.

Influence of annealing conditions on the structure of cobalt phosphate thin films prepared by prompt condensation

247th National Meeting (2014)

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