Organic semiconductors have been the subject of intense study due to technological interest in developing carbon-based electronic devices, most recently inexpensive lightweight flexible solar cells. While much progress has been made in the synthesis and doping of thin film organic semiconductors, there is a dearth of comprehensive, detailed measurements of electronic structure in these materials. The application of synchrotron radiation-based soft x-ray spectroscopies in the study of the electronic structure of a variety of organic semiconductors will be discussed. It will be shown how information on densities of states, energy levels, bonding, band offsets, and interface dipoles can be extracted from the spectroscopic data. Results concerning organic/oxide interfaces will be shown to be of particular importance.

Soft x-ray spectroscopic studies of interfacial electronic structure in small molecule organic solar cells

256th National Meeting (2018)

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