Aluminum doped vanadium oxide films with different Al/V ratios were prepared using hydrothermal method. Characterization of the films have been carried out using cyclic voltammetry, infrared and ultraviolet-visible spectroscopy, X-ray diffractometer, scanning and transition electron microscopy, energy-dispersive X-ray spectroscopy, and X-ray photoelectron spectroscopy. The effect 1-10 wt.% Al doping on of growth temperature, morphology, crystalline structure, and electrical properties will be discussed. The results show that the morphology and crystalline structure are strongly dependent on the Al-doping and growth temperature.

Aluminum doped vanadium oxide films: Hydrothermal synthesis and photoelectrochemical properties

256th National Meeting (2018)

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