Ion transport forms the fundamental basis for many next-generation energy and information technologies. The response of ion transport behavior associated with local features, such as interfaces and defects, to external electric fields often determine the working mechanism and the performance of these systems. Understanding and controlling ion transport behavior at these features requires new approaches for probing the dynamic evolution not only of the atomic-level structure and chemistry, but resultant changes in function. Recent progress in scanning probe and transmission electron microscopy methods have opened new pathways to explore structure and functionality the atomic- to nano-scales, providing vital insight into materials design and system optimization. In this talk, we will focus on introducing new developments in scanning probe microscopy (SPM) and scanning transmission electron microscopy (STEM) for probing nanoscale ion transport. The recent advancements in dynamic Kelvin Probe force microscopy (KPFM), Electrochemical Strain Microscopy (ESM), STEM-based differential phase contrast imaging (DPC), and Electron Vibration Spectroscopy (EVS) at the Center for Nanophase Materials Sciences (CNMS) will be highlighted. These techniques are expected to enable new levels of understanding toward guiding ion transport in energy and informative materials and systems.<br/><br/>

Emerging microscopy techniques for probing interfacial ion transport

256th National Meeting (2018)

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