For the past several decades, electron based microscopy such as transmission electron microscopy and scanning electron microscopy tends to visualize the morphological information of specimens at the atomic/nanometer scale. Especially, electron-beam transmission translates the atomic arrangement in the crystal lattice of a specimen to the contrast on a detector through a thin area of the specimen. Even, nanomaterials can remain separate from neighboring ones to exhibit individual morphologies when their surface energy is under control. However, once high surface energy faces are exposed, nanomaterials tend to aggregate to secondary or higher order assemblies with complex three-dimensional internal structures.<br/>Here, we report coherent x-ray diffraction/absorption microscopy to elucidate detailed physical and chemical information of organic and inorganic materials due to its high penetration depth, less dose damage and wide range of x-ray source. The given microscopy allows to visualize the internal/external structures as well as demonstrate the electronic structures of materials.  <br/>

Coherent X-ray diffraction/absorption microscopy for analyzing organic and inorganic materials

2019 Fall National Meeting

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.