Many classes of materials exhibit heterogeneity, such as phase separation, domain order, and structural inhomogeneities, on nanometer to micrometer length scales. Increasing spatial resolution in optical imaging and spectroscopy has been an important goal in studying these fundamentally and technologically significant material properties. Scattering-based nanospectroscopic techniques combine atomic force microscopy with optical spectroscopy to break the diffraction limit and image electronic and vibrational properties with nanometer spatial resolution. I will discuss nano-Raman and IR spectroscopies to probe properties such as dopant incorporation, isomeric segregation, and chemical modification in inorganic and organic semiconductors. In combination with density functional theory and finite element modeling, nanospectroscopic studies allow us to understand how organization impacts macroscopic electronic properties.

Tip-enhanced spectroscopic imaging of nanoscale chemical and electronic structure

2019 Fall National Meeting

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