Scanning probe microscopy (SPM) represents a powerful tool in nanoscience and nanotechnology. As a popular SPM technique, atomic force microscopy (AFM) has been widely used in many fields including biology, chemistry, physics and materials. In this poster, we first introduce AFM working principle, including the different operational modes of AFM, how AFM can image surface morphology, and continue to describe the sample preparation and procedure of carrying out an AFM experiment. Then, we will present some experimental data on the characterization of different nanomaterials (such as NiWO4, TiO2) and solar cell electrodes using taping mode AFM imaging technique. The high-resolution AFM images show that morphology and size of NiWO4 nanomaterials can be determined. One experiment shows the ability of AFM in determining the hollow-sphere nanoparticles, which is difficult to be determined by other technique such as TEM. AFM also can help reveal different surface morphology before and after depositing TiO2 and platinum nanomaterials on solar cell electrode surface.

Atomic force microscopy (AFM) characterizations of semiconductor nanomaterials and solar cell electrodes

Macromolecular Chemistry: The Second Century

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ACS Spring 2020 National Meeting & Expo

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.