Post synthetic ligand exchange (PSE) is a method of exchanging the organic connecting ligands in metal organic framework (MOF) particles. The physical distribution of new ligand in MOF particles following PSE is often unclear, and may depend on the specific MOF and ligands explored. However, consensus is building in the literature for a gradient ligand distribution from the surface inward following PSE of small ligands. Methods explored to date which probe distribution include Rutherford backscattering (RBS), confocal scanning raman spectroscopy (CSRS), confocal laser scanning microscopy (CLSM), and nuclear magnetic resonance (NMR). Herein, we use x-ray photoelectron spectroscopy (XPS), a common surface science tool, to probe the distribution of PSE ligands in MOF particles under typical PSE conditions of varying time. Specifically, iodo- and diiodo-benzenedicarboxylates (I-bdc/I2-bdc) were exchanged with the native benzenedicarboxylate present in UiO-66. XPS detected the presence of iodine in all samples, revealing a gradient distribution, and provided additional chemical information. Ligand distribution was further explored by using argon bombardment in combination with ball-milling and XPS.

Probing post synthetic ligand exchange in metal organic frameworks using XPS

Macromolecular Chemistry: The Second Century

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ACS Spring 2020 National Meeting & Expo

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.