Zinc selenide (ZnSe) is a uniquely effective substrate in the study of self-assembled monolayers (SAMs) owing to its infrared transparency. This allows for analysis of chemisorbed hexadecanethiol-based (HDT) SAMs using Fourier-Transform Infrared Spectroscopy (FT-IR). A problem with using mechanically polished bulk ZnSe substrates is their high surface roughness relative to the length of the SAMs, which makes certain characterization and future application of created monolayers challenging. In this work we explore ways to produce smoother substrates by growing ZnSe thin films by radio frequency (r.f.) magnetron sputtering on double-polished silicon wafers. In addition to varying r.f. power, Ar sputtering pressure, and substrate bias, we also varied the ion flux by applying an external magnetic field of up to 100 Gauss. Surface roughness was characterized through atomic force microscopy. The optimum settings produced ZnSe films with rms surface roughnesses of 1.6 nm, over an order of magnitude smoother than the bulk ZnSe (40 nm). FTIR and contact angle goniometry confirm successful formation of HDT SAMs from solution on the smoother surfaces.

Growth of smooth zinc selenide thin films for supporting self-assembled monolayers

Macromolecular Chemistry: The Second Century

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ACS Spring 2020 National Meeting & Expo

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