Unit cell structure determination by conventional X-ray methods requires large crystals, which may be difficult to obtain. In this work, we use the method of microcrystal electron diffraction (MicroED) together with grazing-incidence wide-angle X-ray scattering (GIWAXS) to determine high-resolution structures from small crystalline particles of three organic semiconductors of the rylene and diketopyrrolopyrrole classes. Simulated powder patterns from MicroED solved structures and GIWAXS q-space data are matched to provide insight into unit cell arrangement in organic semiconductor thin films, a class of materials whose device properties and electronic behavior are sensitively dependent on solid-state packing.

Unit cell structure determination of organic semiconductors by microcrystal electron diffraction

Macromolecular Chemistry: The Second Century

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ACS Spring 2020 National Meeting & Expo

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.