We present the stochastic collision of semiconducting nanoparticles using tunneling ultramicroelectrodes (UMEs). Minimizing background noise when measuring small currents from single entities is a major problem on the detection of photocurrent of single entities. Although studies have removed the noise using filtering, this process is could lead to aliasing important electrochemical information about the electrochemical methods. Tunneling ultramicroelectrodes have been found to be useful on reducing the background noise. A thin layer of insulator between the electrode surface and the nanoparticle suspension is expected to eliminate most of the parasitic process, which contributes to the noise during the photocurrent measurement in the stochastic collision experiment. We deposited a thin layer of metal oxides on the surface of platinum (Pt) ultramicroelectrode to create a tunneling barrier. Controlling and estimating the thickness of the barrier is essential, and metal oxide deposition on various substrates has been studied using different deposition methods. We compare electrolyzing a precursor solution and a galvanic displacement method, and we will discuss the impact of the tunneling barrier on noise reduction, collision frequency of collision, and the details of the electrochemical response.<br/>

Tunneling ultramicroelectrodes in semiconducting nanoparticle studies

ACS Fall 2020 Virtual Meeting

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