Surface chemical analysis at nanoscale in ambient conditions is challenging but important for the field of microelectronics, materials science, and life science. A novel and easy-to-use system for tip-enhanced Raman spectroscopy (TERS) was proposed by integrating atomic force microscopy (AFM), confocal microscopy, and a micro-sized mirror. Silver nanowires mounted on AFM tips were used to locally enhance the Raman scattering, which avoids signal interference from silicon tips, and also insures an excellent yield of TERS-active tips. The Raman enhancement observed on mechanically exfoliated graphene flakes on oxidized silicon wafer allows quick chemical analysis from a nanoscale region, and thus enable chemical mapping beyond the diffraction limit. Compared with other TERS geometries, the inserted mirror between a sample and the objective lens of the confocal microscope not only allows analysis on large or opaque samples, but also simplifies the alignment processes of the setup.

Novel and easy-to-use tip-enhanced Raman spectroscopy on opaque substrates with a micro-sized mirror and a silver-nanowire tip

243rd National Meeting (2012)

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.