This presentation will describe recent results of our studies of interfaces in single and multiple component  conducting polymer systems carried out using the combination of grazing incidence x-ray scattering (GIXS) and atomic force microscopy (AFM).  Real space AFM images will serve as a basis for models of polymer packing used as an input for simulations of GIXS patterns to be matched to experimental data.  Examples illustrating the use of this approach in single-component systems will be focused on regioregular poly(3-alkylthiophenes) (rr-PATs) and their derivatives, and will  include: (1) polymer-dielectric interfaces of importance in field effect transistors;  (2) impact of polymer backbone and side chains on molecular layering effects, and (3) elucidation of molecular packing in interfibrillar boundaries in rr-PATs.  Multicomponent systems will be illustrated with the blends of rr-PATs with fullerene derivatives functioning as organic photovoltaics.

Grazing incidence small angle scattering and atomic force microscopy studies of interfaces in conducting polymer systems

243rd National Meeting (2012)

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