The four-point resistance, R, of electrodeposited gold nanowires was measured in situ through a laser zone annealing process, where a piezoelectric motor translated the wire over a 532nm, confocal laser spot.  The resulting resistivity measured a reduction of 60% from 2.5x10-7?�m to 1.1x10-7?�m.  The microstructural change was analyzed under transmission electron microscopy (TEM), and the grain diameter was measured from 27�14nm (as-grown) to 90�31nm (post annealed).  The average grain growth diameter was limited to the wire width as the wire neared a bamboo-like structure.  Analytical models primarily considering grain boundary and surface scattering illustrated that the significant contribution to the enhanced conductivity was primarily the reduction of grain boundary density.  This enhanced conductivity was obtained without suffering instability along the wire, namely grain boundary grooving or discontinuity of the wire.  This technique is of interest in improving the microstructure and conductivity of interconnects without the introduction of high thermal energy.

Bamboo-structured gold nanowires through laser zone annealing

243rd National Meeting (2012)

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