Developing a more fundamental understanding of the behavior of ionic liquids at charged solid surfaces is central to realizing new classes of devices in energy, electronics and other applications. Thin films of the ionic liquids 1-ethyl-3-methylimidazolium bis(trifluoromethylsulfonyl)aimide and 1-octyl-3-methylimidazolium bis(trifluoromethylsulfonyl)imide amide (emim+/NTf2- and omim+/NTf2-) were deposited on functionalized Si(111) single crystal surfaces using spin- and dip-coating methods. The cation alkyl chain length was varied in anticipation of future molecular layering studies. The choice of solvent, concentration and annealing conditions were optimized to obtain homogeneous flat films. The thicknesses were determined using ellipsometry, and surface and film topography characterized by scanning electron and atomic force microscopies.  The results of these and other characterization methods are leading to new designer ionic interfaces.

Deposition and characterization of ionic liquid thin films

244th National Meeting (2012)

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