With the ever-increasing interest in, and activity centered on, the use of nanospecies for a wide variety of applications ranging from high-performance heterogeneous catalysts, to sensors, fuel cells, bioimaging and photovoltaic devices, there is much important information about their nature that may be retrieved using electron tomography (ET). But ET studies frequently suffer from problems associated with the limited tilt range that can be explored as well as the beam-sensitivity of the specimens.  Compressed sensing (CS) is a technique that exploits ideas of so-called sparcity and image compression to enable signals to be more accurately recovered from far fewer measurements than are traditionally thought necessary in the use of ET as a probing technique. This contribution outlines the essentials of ET and CS and their application to elucidating the nature of some of the materials mentioned above.

New approaches to the study of nanoparticles: Electron tomography with compressed sensing

244th National Meeting (2012)

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