We have recently grown ice single crystals on TiO2(011) wafers - having a rectangular surface unit cell -  in the presence of water vapor at a temperature of 200K.  A series of in-situ x-ray reflectivity measurements show gradual ice film growth. No ice powder formation is observed, and subsequent measurements of the substrate's 10L oxygen crystal truncation rod show successive addition to the integrated intensity near the anti-Bragg (L~3). Such a change indicates formation of laterally ordered ice at the TiO2-ice interface.  After several hours of growth, millimeter sized crystals are seen on the wafer.  Rocking curves of the in-plane and out of plane ice Bragg peaks confirm the ice film's single crystalline nature.   This work, authors, and the use of the Advanced Photon Source was supported by the U.S. DOE, Office of Basic Energy Sciences under Contract No. DE-AC02-06CH11357. V.K. at Safarik University was supported by VEGA 1/0138/10 and VVCE-0058-007.

In situ X-ray study of epitaxial ice grown on TiO<sub>2</sub>(011)

244th National Meeting (2012)

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In situ X-ray study of epitaxial ice grown on TiO2(011)

In situ X-ray study of epitaxial ice grown on TiO₂(011)