This tutorial will be comprised of two parts. The first section will  cover overall fundamentals of theory and operation of scanning probe  microscopy.  This will include an overview of AFM instrumentation and a  background in AFM operation of contact mode, tapping mode, phase  imaging, advanced multifrequency imaging, tip-sample contact mechanics,  and force curves including common artifacts one encounters during AFM  operation and tips on how to avoid them. Use of online simulation tools for dynamic AFM will also be covered. The second part of the tutorial will cover specific applications of AFM  for polymer materials. This will include imaging of a variety of  polymer materials including thermoplastics, fillers, elastomers, blends,  and composites.  In addition, it will include application of some  advanced methods described in the first part to polymer materials  including multifrequency imaging, thermal analysis, and artifacts  specific to polymers.

Tutorial on scanning probe microscopy for polymer applications

244th National Meeting (2012)

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