Today Raman together with atomic force microscopy (AFM) is becoming a standard and synergistic measurement combination.  Such a combination has many advantages over standard microRaman for providing functional insights into the material being studied.  These advantages include for Raman on-line AFM auto focus for chemical characterization without topographic artifacts, on-line functional and chemical imaging including thermal and electrical characterization and the possibility for nanoscale Raman with tip enhanced Raman spectroscopy.  For SEM it brings the same  functional insights noted above together with optical characterization with near-field scanning optical microscopy.   A preferred method of feedback for such AFM Raman combinations is to use non-optical feedback based on normal force tuning forks feedback with glass probes that have no Raman background and are non-obscuring in terms of the Raman signal or the electron beam.  One important aspect of such tuning fork feedback is the ability to monitor elasticity with greater sensitivity and without artificial processing of the data which is required in beam bounce technology.  Specifically, in standard beam bounce technology there are discontinuities in the operation of the AFM cantilever due to jump to contact and adhesion ringing.  Both of these discontinuities in standard AFM feedback are overcome using the tuning fork.  This presentation will focus on tuning fork based elasticity measurements as correlated with on-line Raman chemical characterization and scanning electron microscopy.

Nanoelasticity measurements using tuning fork frequency modulation correlated with online Raman and scanning electron microscopy imaging

244th National Meeting (2012)

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.