The development of materials for environmentally sustainable energy sources has attracted tremendous attentions recently.  In order to further improve the efficiency to convert and store energy, fundamental understanding of the physical and chemical aspects of interfaces of those devices is essential and the capability to study them in situ at the nanometer-scale under controlled environments is critically needed. Over the past thirty years, scanning probe microscopy (SPM) has established itself as a power surface characterization tool in nanoscience and nanotechnology. In this presentation, recent development of advanced SPM imaging strategies that could expand the breadth of what is measurable in material sciences and break the current limits on detection sensitivity & special resolution will be illustrated. Examples of their applications on energy materials will be presented.

Advances in characterization of energy materials via scanning probe microscopy

245th National Meeting (2013)

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