A reflectron time-of-flight mass spectrometer (R-TOF-MS) was calibrated by maximizing the electrical potentials from the ionization source to the detector. Through the use of a picoammeter, ions were detected throughout the analyzer by setting up a potential difference to attract ions. By measuring these ion currents, accelerating and reflecting voltages were adjusted to maximize the measured ions. These voltages were compared to the theoretical potentials determined using a SimION model of the R-TOF-MS. The samples used for calibration were C-60 fullerene, gallic acid, vanillic acid and 4-hydroxybenzoic acid, which provided a mass range between 168-720 Da. The same samples were used to measure mass spectra via chevron stacked MCP detectors. The data was collected and analyzed using National Instruments LabView software.  The experiments were run multiple times to ensure reproducibility. The spectra obtained were compared to literature spectra to ensure accuracy.  The results of the calibration testing will be presented.

Calibrating a matrix-assisted laser desorption/ionization reflectron time-of-flight mass spectrometer by tracking ion potentials through the mass spectrometer

245th National Meeting (2013)

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