Ferromagnetic thin films with large values of surface spin-polarization are invaluable materials for incorporation into electronic devices where spin-polarization of current is used for device functionality. Point-contact Andreev reflection is one of the few techniques which can directly measure the value of surface spin-polarization. This work presents experimental determination of surface spin-polarization of perovskite oxide thin films. Niobium tips were etched electrochemically in a solution of potassium hydroxide, and point-contact spectra were obtained at 4.2K and fit according to the modified Blonder, Tinkham, and Klapwijk (BTK) theory. Surface spin-polarization values were determined for multiple substances.

Measuring surface spin-polarization of ferromagnetic thin films using point-contact Andreev reflection spectroscopy

245th National Meeting (2013)

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.