The goal of this study was the identification and quantification of error sources in Electrochemical Impedance Spectroscopy (EIS) measurements that originate from the EIS equipment and the measurement protocol in contrast to errors related to the coating itself. EIS data obtained from Tedlar� release films were highly reproducible because these films are homogeneous in composition and thickness. By using defined, homogeneous and defect-free films it was feasible to eliminate error sources in EIS data that are related to the coating itself. It was thus possible to study data variability originating from the EIS measurement procedure such as the upper impedance limit of the potentiostat. Parameters gained from EIS spectra such as film resistivity, dielectric constant and exponent n of the non-ideal capacitance where evaluated as a function of sample area and compared to reference material properties. For larger sample sizes the values obtained by EIS experiments correlated well with the reference values, validating the EIS technique for the determination of absolute values for electrical properties of coatings. However, to obtain an accurate value for film resistivity and relative dielectric constant, a sample area larger than 11.4 cm� was necessary to avoid the introduction of artifacts arising from the EIS instrument and measurement protocol. Recommendations for the reduction of errors in EIS measurements will be discussed.

Use of well-defined polyvinylfluoride films for the quantification of error sources in Electrochemical Impedance Spectroscopy (EIS) data

246th National Meeting (2013)

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