Atomicforce microscope (AFM) is a new type of microscopebased on the principles of scanning tunneling microscope. It can be applied forinvestigating surfaces of conductors, insulators and liquids by measuringforces between the atoms of the tip and the sample throughcontact, non-contact and tapping mode. AFM has been widely used in characterizationof morphology of the graphene-based materials. But it is rarelyreported that AFM (also called KFM: Kelvin force microscopy) can be also usedin the characterization of surface potential of graphene. Inthis contribution, surface potentials of graphene with different typesand quantities of functional groups were measured by AFM throughtapping mode. The relationship between surface potential and surfacefunctional groups was also explored, forming a surface potential-surfacefunctional groups model through which we can speculate one form another.

Characterization of surface potential of graphene by AFM

246th National Meeting (2013)

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