The ability to accurately measure nano-scale structure � property relationships for reverse osmosis membranes is required to inform the design of new materials and improve the overall performance and lifetime. In depth characterization of the thin, non-porous active layer is rendered difficult due to structural limitations and the presence of multiple polymer components. Some advanced characterization techniques require that the membrane be chemically isolated from the rest of the thin film composite and ideally adhered to a rigid, non-polymer substrate such as silicon. A method for covalently bonding the active layer to a silicon substrate has been developed; optical microscopy and FTIR were used as primary evaluation tools. Alternate synthesis methods, such as molecular layer-by-layer deposition, were used to compare isolated commercially produced membranes with structurally ideal, lab synthesized ultra-thin films. Mono-layers, with varying chemistries, were also deposited onto membranes to distinguish the effects of surface roughness and interface chemistry on chlorine attack inhibition and water flux. Surface roughness was quantified by AFM and variations in chemistry were tracked using FTIR and XPS. A quartz crystal microbalance and goniometer were used to determine membrane behavior and surface reactive potential respectively.

Effects of surface roughness and interface chemistry on reverse osmosis membrane performance and lifetime

246th National Meeting (2013)

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