A very limiting factor of the use of electron diffraction for structure determination is the fact that spot intensity Ihkl is not simple equal to the / Fhkl/ 2 ( Fkhl= Structure Factor ). This is the result of �dynamical effects� occurring in electron diffraction. One particular important case on modern nanotechnology is the determination of the structure of ligend covered metal nanoparticles with a well defined number of atoms. The structure determination by x-ray can only be achieved after crystallizing the sample. So far using this method, researchers have been able to determine the structure of Au36, Au28 and Au102. However the crystallization is not easy to achieve and a more general method is needed.In a recent paper (1) we described a method using STEM-Diffraction, combined with image and diffraction patterns calculations and ab initio computations that allow the full determination of the thiol covered Au144. This method sample involves single particle diffraction and is much broader in application.In this talk we will present a discussion of this technique and show a number of applications. Including the extension to Au130 clusters. (1) D. Bahena, N. Bhattarai, U. Santiago, A. Tlahuice, A. Ponce, S. B. H. Bach, B. Yoon, R. L. Whetten, U. Landman, and M. Jose Yacaman, STEM Electron Diffraction and High Resolution Images Used in the Full Determination of the Crystal Structure of Au144(SR)60 Cluster. The Journal of Physical Chemistry Letters, 4 (2013 ), 975-981

Structure determination of nanoparticles using stem diffraction

247th National Meeting (2014)

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