The measurement of electronic properties of single molecules and molecular assemblies is essential in developing molecular electronics to replace the bulky and expensive material used today. Conductive probe atomic force microscopy (CP-AFM) is used to measure electrical properties at the nanoscale.  CP-AFM can simultaneously and independently measure the force, current, and bias at metal-molecule-metal (m-M-m) junctions. These junctions are formed between the AFM probe and self-assembled monolayers (SAMs) attached to an ultra-flat gold surface through a thiol linker. The contact geometry (i.e. the contact between the metal electrodes and the molecules) and intermolecular interactions at these m-M-m junctions play a significant role on conductivity in these systems. This study examines the electrical properties of SAMs composed of biphenyl molecules with single, double, and triple thiol linkers.  The focus being the effect of contact geometry, intermolecular interactions, and molecular packing on the electrical conductivity of these assemblies.

Measuring electronic properties of self-assembled monolayers using conductive probe atomic force microscopy

247th National Meeting (2014)

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