Clusters of thiophene molecules undergo photoionization by 248 nm excimer laser radiation and mass analysis in a time-of-flight mass spectrometer.  (C4H4S)n+ ions in the range n = 1�15 are mass-selected with a time-based double-pulse mass gate and further analyzed by photofragmentation (1064, 532, 355 nm).  The fragmentation patterns are analyzed for information about parent cluster ion structures.  Selected ions are modeled computationally with HF and DFT methods to aid in the interpretation of experimental data.

Photofragmentation of thiophene cluster ions

247th National Meeting (2014)

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.