Using two-photon photoemission electron microscopy (2P-PEEM) we have directly explored the optical fields on a single Ag nanostructure and quantitatively measured the field enhancement factor (FEF).  The 2PPE intensity from the Ag nanostructure is enhanced by 2 orders of magnitude with respect to the 2PPE intensity from a smooth and homogeneous Ag thin film.  This enhancement is attributed to a localized surface plasmon excitation and resonance of the local field, and the FEF is determined to be around 4.  The capability of directly correlating the field enhancement with nanostructures makes 2P-PEEM a promising tool to investigate the fundamental optical properties of nanomaterials.

Direct characterization of surface plasmon enhanced electromagnetic fields on single Ag nanostructure

247th National Meeting (2014)

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