A technique known as FIB (focused ion beam) uses electron microscopy and serial sectioning to visualize the chemical nano-architecture of moving metal-metal contact surfaces lubricated with various additive formulations. The technique employs a focused Ga+ ion beam to pattern a cross section from the surface which is then lifted out with a needle probe. TEM on a thinned crossed section is then used to determine the additive boundary layer thickness, an elemental map of the additive layer, and crystallinity of the layer. Using this technique the effectiveness of various additive components, including friction modifiers and antiwear agents for film formation, can be distinguished and correlated with performance benefits for the corresponding additive components.

Seeing is believing: Advanced visualization of surface active chemistry

249th National Meeting (2015)

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