Clusters of thiophene molecules undergo photoionization by 248 nm excimer laser radiation and mass analysis in a time-of-flight mass spectrometer. Ions of the formula (C4H4S)n+ are observed from n = 1 to n &gt; 20. Selected cluster ions are isolated with a time-based double-pulse mass gate and metastable fragmentation products are measured. The same ions are further probed by photofragmentation (1064, 532, 355 nm). The fragmentation patterns are analyzed for information about parent cluster ion structures. Selected ions are modeled computationally with HF and DFT methods to aid in the interpretation of experimental data.

Metastable fragmentation and photofragmentation of photoionized thiophene clusters

249th National Meeting (2015)

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