Chemical microscopy methods combine information about chemical composition and spatial localization of different molecules and molecular nanosegments. Time-of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a unique technique able to combine mass spectrometry of organic and inorganic materials with imaging of molecules, ions and fragments with a lateral resolution similar to optical microscopy. In this work, we present state-of-the art applications of TOF-SIMS to characterize polysaccharides surfaces in wood tissues, fibres, papers, films, particles and polysaccharide derivatives. We show how chemical microscopy techniques can be combined with adsorption methods for elucidating complex phenomena in biomass pretreatments, enzymatic hydrolysis, bleaching, modification of surfaces of biomaterials and interactions between multifunctional polysaccharides with native cellulose. Chemical microscopy with TOF-SIMS enables detailed understanding of polysaccharide interactions at the molecular level, facilitating processing and engineering of advanced biomaterials.

Chemical microscopy of polysaccharide surfaces using TOF-SIMS

253rd National Meeting (2017)

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