Hard X-ray scanning probe microscopy is particularly well suited to characterizing materials across numerous lengthscales. Recent advances in detector technologies, as well as methods, have vastly increased the ability of scanning probes to acquire large field of views at simultaneously high spatial resolution. Synchrotron generated hard x-ray provide the penetration to probe comparatively ‘thick’ samples, the brightness to achieve high intensity focus spots, and the energy to generate characteristic x-rays up to 10s of keV. In combination, these instruments have the ability to image metals (even in trace quantities), and probe their chemical state at spatial resolutions down to 10s of nm.<br/>We will report on recent advances in hard x-ray scanning probe microscopy, including fast fly-scanning, methods in data analysis, and X-ray fluorescence micro-tomography. We will demonstrate their application in several ongoing studies, ranging from the visualization of trace elemental content in photovoltaic systems, to the role of metals in the deconstruction of wood, to the investigation of trace metals in brain. We will also discuss challenges and opportunities for future scientific applications and instrumentation, in particular with regards to emerging possibilities with diffraction limited storage rings.

Mapping trace metals in hierarchical systems using X-ray fluorescence microscopy

253rd National Meeting (2017)

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