X-ray Photoelectron Spectroscopy is an ubiquitous tool in natural sciences, providing elemental and chemical sensitivity to a large community of scientists in both academia and industry. However, due to the limited mean free path of electrons, this technique remains highly surface sensitive (few nm), and only through sputtering (an intrusive technique) can deeper layers be uncovered. Moreover, the data acquisition imposes quite strict sample environments that requires vacuum and associated instrumentation and personnel overhead. We have recently commissioned a transition edge sensor (TES) based spectrometer at Stanford Synchrotron Radiation Laboratory (SSRL) that has the ability to explore new paradigms in soft x-ray spectroscopy, achieving sensitivity of sub-mMol concentrations in aqueous/organic solvents, sub-percent sensitivity for monolayer films immersed in a solvent, solid matrix, or high-pressure gas, and sensitivity to concentrations &lt;1019/cm3 for defects and dopants in condensed phase samples. Here we present a new detection scheme that makes use of the ability to separately analyze each pixel in the TES sensor array, in which the position of the pixels are mapped onto the angular exit angle from the sample, providing a non-intrusive depth profiling using X-ray Emission, with chemical sensitivity. We demonstrate the applicability of this approach for CIGS-based absorbers, in which the elemental composition and and chemical state near the interface (with the emitter layer CdS) plays an important role in determining the overall efficiency.

XESCA: X-ray emission spectroscopy for chemical analysis

253rd National Meeting (2017)

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