Total reflection X-ray fluorescence (TXRF) is a highly sensitive and selective method for the detection of trace metals. This work develops sol-gel targets to potentially lower TXRF limits of detection by concentrating metal ions within functionalized sol-gel films on TXRF substrates. The sol-gel targets are formulated with precursors specific to chosen metals by grafting or incorporation of selective binding sites during sol-gel formation. Varying production methods of the sol-gels targets were explored, focusing primarily on monoliths for indirect detection and films for direct analysis. Limits of detection for typical solution based and sol-gel target based measurements are compared to demonstrate enhancements in sensitivity.

Development of metal ion specific sol-gel targets for trace metal total reflection X-ray fluorescence analysis

253rd National Meeting (2017)

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