The Atomic Force Microscope has evolved from a laboratory sensation in the late 80’s to an everyday, easy to use tool, thanks to advancements in mechanics, optics, electronics, nano-fabrication, and thanks to the innovations of thousands of researchers and students.<br/>In this talk, we will use our vantage point of nearly three decades of commercial AFM development as Digital Instruments first, then Veeco, and now Bruker,  to retrace the history of the AFM through some of the most significant advances, including the evolution of the dynamic mode of operation from non-contact, to Tapping, and to Peak Force Tapping. With each new mode, AFM has witnessed an expansion to the imaging of new types of samples, from hard matter to polymers and to soft biological samples.  Retracing the parallel history of the AFM probe, we will show how probe and mode developments have conspired to enable the visualization of new nanoscale properties. Propelled by these innovations, AFM has evolved from a topography probe to a versatile tool for measurement of nano-mechanical and nano-electrical properties and their correlation to local chemistry. In closing the presentation we will turn our attention to the next frontiers that AFM may conquer in the near and far future.<br/>

Atomic force microscopy: Past, present, and future

253rd National Meeting (2017)

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