This talk will briefly review principles of both grazing incidence small angle x-ray scattering (GISAXS) and grazing incidence wide angle x-ray scattering (GIWAXS). These techniques have played a key role in understanding structures of organic thin films. GISAXS is for nanoscale structure determination and GIWAXS, also called grazing incidence x-ray diffraction (GIXD), is for molecular or atomic structure determination. Due to their weak signals, these methods are typically useful with a synchrotron X-ray source such as Advanced Photon Source (APS). Recent experimental results on organic films performed at 12-ID-B beamline at the APS will be presented to demonstrate what types of information can be obtained along with practical information such as how to prepare sample, where else the measurement can be done and how data has been analyzed.

Principles and applications of grazing incidence small angle and wide angle x-ray scattering

253rd National Meeting (2017)

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