Neutron Reflectometry, NR, probes the structure at interfaces by providing a depth profile of the scattering length density, SLD, which is a parameter (proportional to the index of refraction) derived from the composition and density. NR has sub-Å precision for the size of features that are large enough to be observed, i.e. those &gt;1-~4nm depending on contrast and other experimental conditions. In addition to non-destructive quantitative analysis, advantages of Neutron Reflectometry include sensitivity to light elements, isotopic control of contrast (enabling one to label layers or reactants of interest), and robust <i>in-operando</i> sample environments, including electrochemical cells with macroscopic liquid reservoirs. Because it relies on mirror reflection, and averages in the plane, samples are typically thin, layered systems on flat substrates similar to Si wafers. These however serve as model analogs to interfaces such as grain boundaries or electrode surfaces in real world systems. It has been widely applied to studies of polymers, trans-membrane proteins, and magnetic thin films. I will introduce the technique and give examples of NR applied Interfaces for Energy Conversion.

<i>In-operando</i> neutron reflectometry: Depth profiles of solid liquid interfaces

254th National Meeting (2017)

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In-operando neutron reflectometry: Depth profiles of solid liquid interfaces