Measuring individual point defects in monolayer WS2 using scanning probe microscopy

Bruno Schuler

Christoph Kastl

Christopher Chen

Sivan Refaely-abramson

Shengjun Yuan

Rafael Roldan

Nicholas Borys

Tevye Kuykendall

D. Frank Ogletree

Jeffrey B Neaton

Shaul Aloni

Adam Schwartzberg

Alexander Weber-Bargioni

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