Scanning ion conductance microscopy (SICM) has emerged as an intriguing alternative to scanning electrochemical microscopy or electrochemical atomic force microscopy for collecting local electrochemical information for a wide variety of samples.  Combining signal processing and probe control with Field Programmable Gate Array (FPGA) -based electronics allows for differential (or self-referenced) images to be collected.  For nanoscale probes where tip conditions might change over long duration measurements, this approach proves especially useful.  We detail the use of FPGA control to provide differential measurements of surface charge and of transport at biological interfaces.  These results highlight the versatility in both applications and approach for FPGA-based SICM measurements.

Quantitation with differential scanning ion conductance microscopy

256th National Meeting (2018)

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.