Low energy electrons, defined as having energy in the 3-20 eV range, have been shown to induce DNA damage. This damage remains localized due to the short mean free path of low energy electrons (LEEs), around 1-10 nm in solution. It is thought that the therapeutic effects from radio sensitization nanoparticles (NPs) can be attributed to emission of these LEEs. An X-ray photoelectron spectroscopy (XPS) set-up has been used to study LEE emission from NP samples and quantify the number and energy of emitted electrons. These results will aid in the development of a universal tool to quantify and measure LEE emission from NPs. This will in turn provide valuable knowledge for the development of therapeutic NPs and a new method to understand their mechanism of action. Our measurements were performed on small NPs composed of mostly polysiloxane, chelated with different metals (Gd, Bi, and Na) to study the effect of LEE emission as a function of the chelated metal. We have reproducibly measured the energy distribution and peak for these clinically relevant nanoparticles. <br/>

New method for quantifying low-energy electron emission from clinically relevant nanoparticles

256th National Meeting (2018)

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