The Silicon Drift Detector, SDD, is an emerging category of semiconductor detectors capable of measuring x-ray photons. They are uniquely capable of measuring x-rays in the fingerprint region below 18 keV. The resolution and capabilities of a silicon drift detector was calibrated using a variety of radioactive elements. The high resolution of silicon drift detector made it possible to distinguish between 235U, 238U, and 239Pu, providing potential applications in nuclear forensics. These isotopes had unique x-ray patterns because the daughter chains are different. Further analysis of data from the silicon drift detector may provide methods to determine isotopic ratios of these elements and additional special nuclear material.

Application of a silicon drift detector to actinide L X-rays

256th National Meeting (2018)

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