Electron microscopy is an indispensable tool for catalyst characterization as it can provide direct information about the catalyst structure at nanometer level. The adaptation of the aberration correction has improved the spatial resolution for transmission electron microscopy down to sub-Ångstrom levels. The drastic improvements in the X-ray detectors and electron spectrometers has expanded the high-resolution imaging capabilities into chemical imaging with sub-nanometer resolution and enabled single atom sensitivity where possible. This talk will focus on the use of aberration corrected transmission electron microscopy on industrially relevant heterogeneous catalysts. Catalysts are complex structures and industrial catalysts are even more so owing to their often less than ideal structure for electron microscopy analysis and potentially high level of non-uniformity. Examples will be shared to showcase what transmission electron microscopy can offer for the characterization of industrial solid catalysts.

Use of transmission electron microscopy for industrial solid catalysts

256th National Meeting (2018)

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