Infrared spectroscopy has developed into a powerful analytical technique to probe molecular vibratioanl modes, crystalline phonon modes, and low energy electronic excitations. However, diffraction and the long wavelengths of infrared light have traditionally limited the spatial resolution of infrared techniques to the micron scale. Synchrotron infrared nanospectroscopy (SINS) overcomes this limitation by combining the broad, spectally bright, and spatially coherent source characteristics of synchrotron infrared radiation with scattering type, scanning near-field optical microscopy (s-SNOM). By focusing and scattering synchrotron IR light off a metallic AFM tip in close proximity to the sample, the SINS technique dramatically improves the spatial resolution by several orders of magnitude to &lt; 25 nm while still enabling sensitive vibrational spectroscopy spanning the entire mid- and far-infrared regions. The Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory operates two infrared beamlines with SINS instruments that are available to general users. Here, we present the technical aspects of the technique and highlight several applications to soft and hard matter systems, including proteins, organic semi-conductors, catalysts, 2D materials, and phase-change materials.

Synchrotron infrared nanospectroscopy at the advanced light source

2019 Fall National Meeting

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