Sonic Infrared (SIR) Imaging is a novel hybrid NDE method that has seen rapid acceptance in the industry. SIR uses ultrasonic-generated heat as a defect detection mechanism. The ultrasonic excitation is a second or a fraction-of-a-second pulse in the 15 to 40 KHz range generated by a piezoelectric transducer which produces localized heating at the defect that will be captured by a thermal sensor. In a previous article, we presented a model that can be used to describe heat diffusion from delamination in composites. The model uses certain aspects of the temperature-time curve for defect depth profiling, namely, half-maximum power time, the peak slope time and the second derivative peak time. It was demonstrated that a linear relationship between the depth squared and any of these features can be established for depth profiling. According to the proposed model, several factors contribute to the total temperature-time curve and influence defect characterization. In addition to material properties, the model considers the defect’s depth, size, and duration of ultrasonic excitation. In this study, we investigate the effect of ultrasonic excitation duration on the quantitative estimation of the defect’s depth. The model suggests that increasing the ultrasonic excitation will shift the temperature-time curve captured at the surface to the right resulting in an increase in the features of interest used for depth profiling. However, the features of interest respond differently to such increase. The theoretical results are calculated and compared with the experimental data. We demonstrate that the experimental data have a good correlation with the theoretical calculations.


The Effect of Ultrasonic Excitation Duration on the Quantitative Estimation of Defect Depth Using Sonic Infrared Imaging

No proceedings papers in 2020. Video only.

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