In many industries, such as automotive, oil and gas, aerospace, medical technologies, electronic parts can often be exposed to high strain loads during shocks, vibrations and drop-impact conditions. Such electronic parts can often be subjected to extreme low and high temperatures ranging from -65^o^C to 200^o^C. Also, these electronic devices can be subjected to strain rates of 1 to 100 per second in the critical environment. Recently, many doped SAC solder alloys are being introduced in the electronic component e.g. SAC-Q, SAC-R, Innolot, etc. SAC-Q is made with addition of Bi in Sn-Ag-Cu are composition. Mechanical characteristic results and data for lead-free solder alloys are extremely important for optimizing electronic package reliability, at high temperature storage and elevated strain rates. Furthermore, the mechanical properties of solder alloys can be changed significantly due to a thermal aging, which is causing modification of microstructure. Data for the SAC-Q solder alloy with a high temp aging and testing at extreme low to high operating temperatures are not available.   

SAC-Q material was tested and analyzed for this study at range of operating temperatures of -65^o^C to 200^o^C and at a strain rate up to 75 per second. After the specimens were manufactured and reflowed, specimens were stored at 100^o^C for the isothermal aging for up to 90 days,  before  tensile tests were carried out at different operating temperatures. For the wide range of strain rates and test temperatures, stress-strain curves are established. In addition, the measured experimental results and data were fitted to the Anand viscoplasticity model and the Anand constants were calculated by estimating the stress-strain behavior measured in the wide range of operating temperatures and strain rates


High Strain Rate Mechanical Properties of Sac-Q Between -65 C and +200 C After Exposure to Iso-Thermal Aging Up to 90 Days

Division / Sponsors: 
Electronic & Photonic Packaging Division (EPPD)

Paper Proceedings: https://asmedigitalcollection.asme.org/InterPACK/InterPACK2020/volume/84041

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