The current method for preparing particles for nuclear safeguards particle analysis involves dissolving particles in a polymer thin film that is neutron-irradiated to enable fission track location, then removing these particles for electron microscopy and thermal ionization mass spectrometry. The overall process involves a great deal of intensive, manual particle handling and is more time consuming than desired. A collaborative effort between Lawrence Berkeley National Lab (LBNL), Pacific Northwest National Lab (PNNL), and Brookhaven National Lab (BNL) seeks to remedy several of these issues by using a suite of x-ray techniques to perform this analysis without removing those particles from the polymer thin films. Recent experiments performed at the Advanced Light Source (ALS) at LBNL in both the tender x-ray and hard x-ray regimes have made progress towards these objectives. The first effort has focused on evaluating and developing tender x-ray micro-XRF techniques at ALS Beamline 10.3.2 utilizing a specialized sample chamber and specifically improving the XRF capability for lighter elements. The second has exploited the unique optical characteristics of Beamline. 8.3.2 to develop new methodologies for rapid particle location through full-field x-ray microscopy.

Tender micro-XRF and full-field microscopy for nuclear safeguards particle analysis

ACS Fall 2021

The official archive and repository for all ACS Meetings & Expositions abstracts and select posters or presentations.